MCU
Test Extension
for Digital By-pass

Patented MCU® technology provides a "digital" by-pass pair for centralized loop testing through Digital Loop Carrier systems.

Digital Loop Carrier (DLC) systems have been remotely deployed to provide subscriber services through shorter copper loops with fiber- or copper-fed backhaul to the central office. With DLC deployments, testability from the central office is compromised as the direct copper link to the switch is substituted with a multiplexed digital fiber or copper link.

Tollgrade’s MCU technology extends the reach of switch-based test access via a simulated “metallic channel” supported over universal or integrated DLC configurations. By extending the reach of switch-based test heads, MCU channel units maintain testability and dispatch efficiency for DLC-served subscribers.